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In situ X-ray diffraction study of crystallization process of GeSbTe thin films during heat treatment
In situ X-ray diffraction study of crystallization process of GeSbTe thin films during heat treatment
In situ X-ray diffraction study of crystallization process of GeSbTe thin films during heat treatment
Kato, N. (author) / Konomi, I. (author) / Seno, Y. (author) / Motohiro, T. (author)
APPLIED SURFACE SCIENCE ; 244 ; 281-284
2005-01-01
4 pages
Article (Journal)
English
DDC:
621.35
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