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In situ X-ray diffraction study of crystallization process of GeSbTe thin films during heat treatment
In situ X-ray diffraction study of crystallization process of GeSbTe thin films during heat treatment
In situ X-ray diffraction study of crystallization process of GeSbTe thin films during heat treatment
Kato, N. ( Autor:in ) / Konomi, I. ( Autor:in ) / Seno, Y. ( Autor:in ) / Motohiro, T. ( Autor:in )
APPLIED SURFACE SCIENCE ; 244 ; 281-284
01.01.2005
4 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
621.35
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