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    Electrical characteristics of V2O5 thin films formed on p-Si by sputter-deposition and rapid thermal annealing

    New search for: Yoon, M. H.
    New search for: Im, S.

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    Electrical characteristics of V2O5 thin films formed on p-Si by sputter-deposition and rapid thermal annealing

    New search for: Yoon, M. H.
    New search for: Im, S.

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    Check availability in my library
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    Electrical characteristics of V2O5 thin films formed on p-Si by sputter-deposition and rapid thermal annealing

    New search for: Yoon, M. H.
    New search for: Im, S.

    Access

    Access via TIB
    Check availability in my library
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    Document information
    Title:

    Electrical characteristics of V2O5 thin films formed on p-Si by sputter-deposition and rapid thermal annealing

    Contributors:

    Yoon, M. H. (author) / Im, S. (author)

    Published in:

    APPLIED SURFACE SCIENCE ; 244 ; 444-448

    Publication date:

    2005-01-01

    Size:

    5 pages

    ISSN:

    0169-4332

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  621.35

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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