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    Thickness dependence of optical properties of VO2 thin films epitaxially grown on sapphire (0001)

    New search for: Xu, G.
    New search for: Jin, P.
    New search for: Tazawa, M.
    New search for: Yoshimura, K.

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    Thickness dependence of optical properties of VO2 thin films epitaxially grown on sapphire (0001)

    New search for: Xu, G.
    New search for: Jin, P.
    New search for: Tazawa, M.
    New search for: Yoshimura, K.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Thickness dependence of optical properties of VO2 thin films epitaxially grown on sapphire (0001)

    New search for: Xu, G.
    New search for: Jin, P.
    New search for: Tazawa, M.
    New search for: Yoshimura, K.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

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    Document information
    Similar titles

    Export, share and cite

    Document information
    Title:

    Thickness dependence of optical properties of VO2 thin films epitaxially grown on sapphire (0001)

    Contributors:

    Xu, G. (author) / Jin, P. (author) / Tazawa, M. (author) / Yoshimura, K. (author)

    Published in:

    APPLIED SURFACE SCIENCE ; 244 ; 449-452

    Publication date:

    2005-01-01

    Size:

    4 pages

    ISSN:

    0169-4332

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  621.35

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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