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    Evaluation of stress field parameters for an interface crack in a bimaterial by digital photoelasticity

    New search for: Ravichandran, M.
    New search for: Ramesh, K.

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    Evaluation of stress field parameters for an interface crack in a bimaterial by digital photoelasticity

    New search for: Ravichandran, M.
    New search for: Ramesh, K.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Evaluation of stress field parameters for an interface crack in a bimaterial by digital photoelasticity

    New search for: Ravichandran, M.
    New search for: Ramesh, K.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

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    Check availability in my library
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    Document information
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    Document information
    Title:

    Evaluation of stress field parameters for an interface crack in a bimaterial by digital photoelasticity

    Contributors:

    Ravichandran, M. (author) / Ramesh, K. (author)

    Published in:

    JOURNAL OF STRAIN ANALYSIS FOR ENGINEERING DESIGN ; 40 ; 327-344

    Publication date:

    2005-01-01

    Size:

    18 pages

    ISSN:

    0309-3247

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  624.176

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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