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ToF-SIMS imaging: a valuable chemical microscopy technique for paper and paper coatings
ToF-SIMS imaging: a valuable chemical microscopy technique for paper and paper coatings
ToF-SIMS imaging: a valuable chemical microscopy technique for paper and paper coatings
Fardim, P. (author) / Holmbom, B. (author)
APPLIED SURFACE SCIENCE ; 249 ; 393-407
2005-01-01
15 pages
Article (Journal)
English
DDC:
621.35
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