Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
ToF-SIMS imaging: a valuable chemical microscopy technique for paper and paper coatings
ToF-SIMS imaging: a valuable chemical microscopy technique for paper and paper coatings
ToF-SIMS imaging: a valuable chemical microscopy technique for paper and paper coatings
Fardim, P. (Autor:in) / Holmbom, B. (Autor:in)
APPLIED SURFACE SCIENCE ; 249 ; 393-407
01.01.2005
15 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
621.35
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