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    Sub-10 nm High-Aspect-Ratio Patterning of ZnO Using an Electron Beam

    New search for: Saifullah, M. S. M.
    New search for: Subramanian, K. R. V.
    New search for: Kang, D.-J.
    New search for: Anderson, D.
    New search for: Huck, W. T. S.
    New search for: Jones, G. A. C.
    New search for: Welland, M. E.

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    Sub-10 nm High-Aspect-Ratio Patterning of ZnO Using an Electron Beam

    New search for: Saifullah, M. S. M.
    New search for: Subramanian, K. R. V.
    New search for: Kang, D.-J.
    New search for: Anderson, D.
    New search for: Huck, W. T. S.
    New search for: Jones, G. A. C.
    New search for: Welland, M. E.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Sub-10 nm High-Aspect-Ratio Patterning of ZnO Using an Electron Beam

    New search for: Saifullah, M. S. M.
    New search for: Subramanian, K. R. V.
    New search for: Kang, D.-J.
    New search for: Anderson, D.
    New search for: Huck, W. T. S.
    New search for: Jones, G. A. C.
    New search for: Welland, M. E.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

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    Document information
    Title:

    Sub-10 nm High-Aspect-Ratio Patterning of ZnO Using an Electron Beam

    Contributors:

    Saifullah, M. S. M. (author) / Subramanian, K. R. V. (author) / Kang, D.-J. (author) / Anderson, D. (author) / Huck, W. T. S. (author) / Jones, G. A. C. (author) / Welland, M. E. (author)

    Published in:

    ADVANCED MATERIALS -DEERFIELD BEACH THEN WEINHEIM- ; 17 ; 1757-1761

    Publication date:

    2005-01-01

    Size:

    5 pages

    ISSN:

    0935-9648

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.11

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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