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Patterning: High Aspect Ratio Sub-15 nm Silicon Trenches From Block Copolymer Templates (Adv. Mater. 42/2012)
Patterning: High Aspect Ratio Sub-15 nm Silicon Trenches From Block Copolymer Templates (Adv. Mater. 42/2012)
Patterning: High Aspect Ratio Sub-15 nm Silicon Trenches From Block Copolymer Templates (Adv. Mater. 42/2012)
Gu, X. (author) / Liu, Z. (author) / Gunkel, I. (author) / Chourou, S. T. (author) / Hong, S. W. (author) / Olynick, D. L. (author) / Russell, T. P. (author)
ADVANCED MATERIALS -DEERFIELD BEACH THEN WEINHEIM- ; 24 ; 5687-5687
2012-01-01
1 pages
Article (Journal)
English
DDC:
620.11
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