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High spatial resolution stress measurements using synchrotron based scanning X-ray microdiffraction with white or monochromatic beam

Tamura, N. / Padmore, H. A. / Patel, J. R.

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High spatial resolution stress measurements using synchrotron based scanning X-ray microdiffraction with white or monochromatic beam

Tamura, N. / Padmore, H. A. / Patel, J. R.

High spatial resolution stress measurements using synchrotron based scanning X-ray microdiffraction with white or monochromatic beam

Tamura, N. / Padmore, H. A. / Patel, J. R.

Access

Access via TIB

Check availability in my library

Order at Subito €

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Document information

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Document information

Title:

High spatial resolution stress measurements using synchrotron based scanning X-ray microdiffraction with white or monochromatic beam

Contributors:

Tamura, N. (author) / Padmore, H. A. (author) / Patel, J. R. (author)

Published in:

MATERIALS SCIENCE AND ENGINEERING A ; 399 ; 92-98

Publication date:

2005-01-01

Size:

7 pages

ISSN:

0921-5093

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 620.11

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