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    In situ transmission electron microscopy studies of electric-field-induced phenomena in ferroelectrics

    New search for: Tan, X.
    New search for: He, H.
    New search for: Shang, J.-K.

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    In situ transmission electron microscopy studies of electric-field-induced phenomena in ferroelectrics

    New search for: Tan, X.
    New search for: He, H.
    New search for: Shang, J.-K.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    In situ transmission electron microscopy studies of electric-field-induced phenomena in ferroelectrics

    New search for: Tan, X.
    New search for: He, H.
    New search for: Shang, J.-K.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Document information
    Title:

    In situ transmission electron microscopy studies of electric-field-induced phenomena in ferroelectrics

    Contributors:

    Tan, X. (author) / He, H. (author) / Shang, J.-K. (author)

    Published in:

    JOURNAL OF MATERIALS RESEARCH -PITTSBURGH THEN WARRENDALE- ; 20 ; 1641-1653

    Publication date:

    2005-01-01

    Size:

    13 pages

    ISSN:

    0884-2914

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.11

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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