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Transmission electron microscopy studies of the bonded SiC-SiC interface

Yushin, G. N. / Kvit, A. V. / Sitar, Z.

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Transmission electron microscopy studies of the bonded SiC-SiC interface

Yushin, G. N. / Kvit, A. V. / Sitar, Z.

Transmission electron microscopy studies of the bonded SiC-SiC interface

Yushin, G. N. / Kvit, A. V. / Sitar, Z.

Access

Access via TIB

Check availability in my library

Order at Subito €

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Document information

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Document information

Title:

Transmission electron microscopy studies of the bonded SiC-SiC interface

Contributors:

Yushin, G. N. (author) / Kvit, A. V. (author) / Sitar, Z. (author)

Published in:

JOURNAL OF MATERIALS SCIENCE ; 40 ; 4369-4371

Publication date:

2005-01-01

Size:

3 pages

ISSN:

0022-2461

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 620.11

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