Fachinformationsdienst BAUdigital

A platform for research: civil engineering, architecture and urbanism

    Non-Destructive Evaluation of Semiconductor Package by Electronic Speckle Pattern Interferometry

    New search for: Kim, K.
    New search for: Kang, K.
    New search for: Jung, S.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Non-Destructive Evaluation of Semiconductor Package by Electronic Speckle Pattern Interferometry

    New search for: Kim, K.
    New search for: Kang, K.
    New search for: Jung, S.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Non-Destructive Evaluation of Semiconductor Package by Electronic Speckle Pattern Interferometry

    New search for: Kim, K.
    New search for: Kang, K.
    New search for: Jung, S.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Document information
    Title:

    Non-Destructive Evaluation of Semiconductor Package by Electronic Speckle Pattern Interferometry

    Contributors:

    Kim, K. (author) / Kang, K. (author) / Jung, S. (author)

    Published in:

    JOURNAL OF MECHANICAL SCIENCE AND TECHNOLOGY ; 19 ; 820-825

    Publication date:

    2005-01-01

    Size:

    6 pages

    ISSN:

    1738-494X

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  621

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

    Similar titles

    Evaluation of fracture mechanic's parameters using electronic speckle pattern interferometry

    Moore, A. J. / Tyrer, J. R. | British Library Online Contents | 1994

    Electronic Speckle Pattern Interferometry on a Microscopic Scale

    Deaton, J. B. / Wagner, J. W. / Rogowski, R. S. | British Library Online Contents | 1994

    Electronic speckle pattern interferometry for marble erosion measurements

    Paoletti, D. / Schirripa Spagnolo, G. / Quaresima, R. et al. | British Library Conference Proceedings | 1992

    PIXEL QUALITY EVALUATION AND CORRECTION PROCEDURES IN ELECTRONIC SPECKLE PATTERN INTERFEROMETRY

    An, Y. / Schajer, G. S. | British Library Online Contents | 2011

    Recent developments and applications in electronic speckle pattern interferometry

    Petzing, J. N. / Tyrer, J. R. | British Library Online Contents | 1998

    Back to top