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Microscopic strain mapping using scanning electron microscopy topography image correlation at large strain
Microscopic strain mapping using scanning electron microscopy topography image correlation at large strain
Microscopic strain mapping using scanning electron microscopy topography image correlation at large strain
Kang, J. (author) / Jain, M. (author) / Wilkinson, D. S. (author) / Embury, J. D. (author)
JOURNAL OF STRAIN ANALYSIS FOR ENGINEERING DESIGN ; 40 ; 559-570
2005-01-01
12 pages
Article (Journal)
English
DDC:
624.176
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