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    Microscopic strain mapping using scanning electron microscopy topography image correlation at large strain

    New search for: Kang, J.
    New search for: Jain, M.
    New search for: Wilkinson, D. S.
    New search for: Embury, J. D.

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    Microscopic strain mapping using scanning electron microscopy topography image correlation at large strain

    New search for: Kang, J.
    New search for: Jain, M.
    New search for: Wilkinson, D. S.
    New search for: Embury, J. D.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Microscopic strain mapping using scanning electron microscopy topography image correlation at large strain

    New search for: Kang, J.
    New search for: Jain, M.
    New search for: Wilkinson, D. S.
    New search for: Embury, J. D.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Document information
    Title:

    Microscopic strain mapping using scanning electron microscopy topography image correlation at large strain

    Contributors:

    Kang, J. (author) / Jain, M. (author) / Wilkinson, D. S. (author) / Embury, J. D. (author)

    Published in:

    JOURNAL OF STRAIN ANALYSIS FOR ENGINEERING DESIGN ; 40 ; 559-570

    Publication date:

    2005-01-01

    Size:

    12 pages

    ISSN:

    0309-3247

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  624.176

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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