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    Trapped Particle Detection in Bonded Semiconductors Using Gray-field Photoelastic Imaging

    New search for: Horn, G.
    New search for: Mackin, T. J.
    New search for: Lesniak, J.

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    Trapped Particle Detection in Bonded Semiconductors Using Gray-field Photoelastic Imaging

    New search for: Horn, G.
    New search for: Mackin, T. J.
    New search for: Lesniak, J.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Trapped Particle Detection in Bonded Semiconductors Using Gray-field Photoelastic Imaging

    New search for: Horn, G.
    New search for: Mackin, T. J.
    New search for: Lesniak, J.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

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    Document information
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    Document information
    Title:

    Trapped Particle Detection in Bonded Semiconductors Using Gray-field Photoelastic Imaging

    Contributors:

    Horn, G. (author) / Mackin, T. J. (author) / Lesniak, J. (author)

    Published in:

    EXPERIMENTAL MECHANICS ; 45 ; 457-466

    Publication date:

    2005-01-01

    Size:

    10 pages

    ISSN:

    0014-4851

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.1

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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