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Characterization of ultra-low-load (muN) nanoindents in GaAs(100) using a cube corner tip
Characterization of ultra-low-load (muN) nanoindents in GaAs(100) using a cube corner tip
Characterization of ultra-low-load (muN) nanoindents in GaAs(100) using a cube corner tip
Taylor, C. R. (author) / Malshe, A. P. (author) / Salamo, G. (author) / Prince, R. N. (author) / Riester, L. (author) / Cho, S. O. (author)
SMART MATERIALS AND STRUCTURES ; 14 ; 963-970
2005-01-01
8 pages
Article (Journal)
English
DDC:
530
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Recent Progress in the 3D Experimentation and Simulation of Nanoindents
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