AES depth profiling and interface analysis of C/Ta bilayers: Fid-Bau Portal

AES depth profiling and interface analysis of C/Ta bilayers

Zalar, A. / Kovac, J. / Pracek, B. / Hofmann, S. / Panjan, P.

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AES depth profiling and interface analysis of C/Ta bilayers

Zalar, A. / Kovac, J. / Pracek, B. / Hofmann, S. / Panjan, P.

AES depth profiling and interface analysis of C/Ta bilayers

Zalar, A. / Kovac, J. / Pracek, B. / Hofmann, S. / Panjan, P.

Access

Access via TIB

Check availability in my library

Order at Subito €

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Document information

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Document information

Title:

AES depth profiling and interface analysis of C/Ta bilayers

Contributors:

Zalar, A. (author) / Kovac, J. (author) / Pracek, B. (author) / Hofmann, S. (author) / Panjan, P. (author)

Published in:

APPLIED SURFACE SCIENCE ; 252 ; 2056-2062

Publication date:

2005-01-01

Size:

7 pages

ISSN:

0169-4332

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 621.35

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