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    Determination of Ge content in high concentration Ge-doped Czochralski Si single crystals by FTIR

    New search for: Jiang, Z.
    New search for: Zhang, W.
    New search for: Niu, X.

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    Determination of Ge content in high concentration Ge-doped Czochralski Si single crystals by FTIR

    New search for: Jiang, Z.
    New search for: Zhang, W.
    New search for: Niu, X.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Determination of Ge content in high concentration Ge-doped Czochralski Si single crystals by FTIR

    New search for: Jiang, Z.
    New search for: Zhang, W.
    New search for: Niu, X.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Document information
    Title:

    Determination of Ge content in high concentration Ge-doped Czochralski Si single crystals by FTIR

    Contributors:

    Jiang, Z. (author) / Zhang, W. (author) / Niu, X. (author)

    Published in:

    RARE METALS -BEIJING- ENGLISH EDITION ; 24 ; 226-228

    Publication date:

    2005-01-01

    Size:

    3 pages

    ISSN:

    1001-0521

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  669

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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