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    Fatigue fracture of embedded copper conductors in multifunctional composite structures

    New search for: Kim, H.
    New search for: Park, M.
    New search for: Hsieh, K.

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    Fatigue fracture of embedded copper conductors in multifunctional composite structures

    New search for: Kim, H.
    New search for: Park, M.
    New search for: Hsieh, K.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Fatigue fracture of embedded copper conductors in multifunctional composite structures

    New search for: Kim, H.
    New search for: Park, M.
    New search for: Hsieh, K.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Document information
    Title:

    Fatigue fracture of embedded copper conductors in multifunctional composite structures

    Contributors:

    Kim, H. (author) / Park, M. (author) / Hsieh, K. (author)

    Published in:

    COMPOSITES SCIENCE AND TECHNOLOGY ; 66 ; 1010-1021

    Publication date:

    2006-01-01

    Size:

    12 pages

    ISSN:

    0266-3538

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.118

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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