A platform for research: civil engineering, architecture and urbanism
A platform for research: civil engineering, architecture and urbanism
Metallic thin film depth measurements by X-ray microanalysis
Metallic thin film depth measurements by X-ray microanalysis
Metallic thin film depth measurements by X-ray microanalysis
Ng, F. L. (author) / Wei, J. (author) / Lai, F. K. (author) / Goh, K. L. (author)
APPLIED SURFACE SCIENCE ; 252 ; 3972-3976
2006-01-01
5 pages
Article (Journal)
English
DDC:
621.35
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