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Ferroelectric Properties of Pb(Zr,Ti)O~3 Thin Film Capacitors Made by RF Magnetron Sputtering and Heat-Treated by the Bottom Electrode Crystallization Method
Ferroelectric Properties of Pb(Zr,Ti)O~3 Thin Film Capacitors Made by RF Magnetron Sputtering and Heat-Treated by the Bottom Electrode Crystallization Method
Ferroelectric Properties of Pb(Zr,Ti)O~3 Thin Film Capacitors Made by RF Magnetron Sputtering and Heat-Treated by the Bottom Electrode Crystallization Method
Mardare, A. I. (author) / Mardare, C. C. (author) / Savu, R. (author) / Vilarinho, P. M.
2006-01-01
5 pages
Article (Journal)
English
DDC:
620.11
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