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Ferroelectric Properties of Pb(Zr,Ti)O~3 Thin Film Capacitors Made by RF Magnetron Sputtering and Heat-Treated by the Bottom Electrode Crystallization Method
Ferroelectric Properties of Pb(Zr,Ti)O~3 Thin Film Capacitors Made by RF Magnetron Sputtering and Heat-Treated by the Bottom Electrode Crystallization Method
Ferroelectric Properties of Pb(Zr,Ti)O~3 Thin Film Capacitors Made by RF Magnetron Sputtering and Heat-Treated by the Bottom Electrode Crystallization Method
Mardare, A. I. (Autor:in) / Mardare, C. C. (Autor:in) / Savu, R. (Autor:in) / Vilarinho, P. M.
01.01.2006
5 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
620.11
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