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    X-ray photoelectron spectroscopy characterization of oxidated Si particles formed by pulsed ion-beam ablation

    New search for: Zhu, X. P.
    New search for: Yukawa, T.
    New search for: Hirai, M.
    New search for: Suematsu, H.
    New search for: Jiang, W.
    New search for: Yatsui, K.
    New search for: Nishiyama, H.
    New search for: Inoue, Y.

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    X-ray photoelectron spectroscopy characterization of oxidated Si particles formed by pulsed ion-beam ablation

    New search for: Zhu, X. P.
    New search for: Yukawa, T.
    New search for: Hirai, M.
    New search for: Suematsu, H.
    New search for: Jiang, W.
    New search for: Yatsui, K.
    New search for: Nishiyama, H.
    New search for: Inoue, Y.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    X-ray photoelectron spectroscopy characterization of oxidated Si particles formed by pulsed ion-beam ablation

    New search for: Zhu, X. P.
    New search for: Yukawa, T.
    New search for: Hirai, M.
    New search for: Suematsu, H.
    New search for: Jiang, W.
    New search for: Yatsui, K.
    New search for: Nishiyama, H.
    New search for: Inoue, Y.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

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    Document information
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    Document information
    Title:

    X-ray photoelectron spectroscopy characterization of oxidated Si particles formed by pulsed ion-beam ablation

    Contributors:

    Zhu, X. P. (author) / Yukawa, T. (author) / Hirai, M. (author) / Suematsu, H. (author) / Jiang, W. (author) / Yatsui, K. (author) / Nishiyama, H. (author) / Inoue, Y. (author)

    Published in:

    APPLIED SURFACE SCIENCE ; 252 ; 5776-5782

    Publication date:

    2006-01-01

    Size:

    7 pages

    ISSN:

    0169-4332

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  621.35

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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