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Effect of interface traps on Debye thickness semiconductor films

Sandomirsky, V. / Butenko, A. V. / Kolobov, I. G. / Ronen, A. / Schlesinger, Y.

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Effect of interface traps on Debye thickness semiconductor films

Sandomirsky, V. / Butenko, A. V. / Kolobov, I. G. / Ronen, A. / Schlesinger, Y.

Effect of interface traps on Debye thickness semiconductor films

Sandomirsky, V. / Butenko, A. V. / Kolobov, I. G. / Ronen, A. / Schlesinger, Y.

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Check availability in my library

Order at Subito €

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Document information

Title:

Effect of interface traps on Debye thickness semiconductor films

Contributors:

Sandomirsky, V. (author) / Butenko, A. V. (author) / Kolobov, I. G. (author) / Ronen, A. (author) / Schlesinger, Y. (author)

Published in:

APPLIED SURFACE SCIENCE ; 252 ; 5793-5802

Publication date:

2006-01-01

Size:

10 pages

ISSN:

0169-4332

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 621.35

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