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    Scanning techniques applied to the characterisation of P and N type multicrystalline silicon

    New search for: Martinuzzi, S.
    New search for: Palais, O.
    New search for: Ostapenko, S.

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    Scanning techniques applied to the characterisation of P and N type multicrystalline silicon

    New search for: Martinuzzi, S.
    New search for: Palais, O.
    New search for: Ostapenko, S.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Scanning techniques applied to the characterisation of P and N type multicrystalline silicon

    New search for: Martinuzzi, S.
    New search for: Palais, O.
    New search for: Ostapenko, S.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Document information
    Title:

    Scanning techniques applied to the characterisation of P and N type multicrystalline silicon

    Contributors:

    Martinuzzi, S. (author) / Palais, O. (author) / Ostapenko, S. (author)

    Published in:

    MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING ; 9 ; 230-235

    Publication date:

    2006-01-01

    Size:

    6 pages

    ISSN:

    1369-8001

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  621.38152

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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