Fachinformationsdienst BAUdigital

A platform for research: civil engineering, architecture and urbanism

    Application of scanning deep level transient spectroscopy for characterisation of multicrystalline silicon

    New search for: Knobloch, K.
    New search for: Seifert, W.
    New search for: Kittler, M.
    New search for: Balkanski, M.
    New search for: Kamimura, H.
    New search for: Mahajan, S.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Application of scanning deep level transient spectroscopy for characterisation of multicrystalline silicon

    New search for: Knobloch, K.
    New search for: Seifert, W.
    New search for: Kittler, M.
    New search for: Balkanski, M.
    New search for: Kamimura, H.
    New search for: Mahajan, S.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Application of scanning deep level transient spectroscopy for characterisation of multicrystalline silicon

    New search for: Knobloch, K.
    New search for: Seifert, W.
    New search for: Kittler, M.
    New search for: Balkanski, M.
    New search for: Kamimura, H.
    New search for: Mahajan, S.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Document information
    Title:

    Application of scanning deep level transient spectroscopy for characterisation of multicrystalline silicon

    Contributors:

    Knobloch, K. (author) / Seifert, W. (author) / Kittler, M. (author) / Balkanski, M. / Kamimura, H. / Mahajan, S.

    Published in:

    Solid-State Materials for Advanced Technology ; 254-259

    MATERIALS SCIENCE AND ENGINEERING -LAUSANNE- B ; 42

    Publication date:

    1996-01-01

    Size:

    6 pages

    ISSN:

    0921-5107

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.11

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

    Similar titles

    Deep-level transient spectroscopy characterization of electrical traps in p-type multicrystalline silicon with gettering and hydrogenation process

    Zheng, Xiong / Zhou, Chunlan / Jia, Xiaojie et al. | British Library Online Contents | 2018

    Deep-level transient spectroscopy characterization of electrical traps in p-type multicrystalline silicon with gettering and hydrogenation process

    Zheng, Xiong / Zhou, Chunlan / Jia, Xiaojie et al. | British Library Online Contents | 2018

    Scanning techniques applied to the characterisation of P and N type multicrystalline silicon

    Martinuzzi, S. / Palais, O. / Ostapenko, S. | British Library Online Contents | 2006

    Scanning Kelvin probe and surface photovoltage analysis of multicrystalline silicon

    Castaldini, A. / Cavalcoli, D. / Cavallini, A. et al. | British Library Online Contents | 2002

    Spatially resolved deep level transient spectroscopy using a scanning tunneling microscope

    Maeda, K. / Uota, M. / Mera, Y. | British Library Online Contents | 1996

    Back to top