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    Reliability during Thermal Shock Testing of NiCr Films on Mn-Ni-Co Oxide Substrates

    New search for: Jeon, M. S.
    New search for: Song, J. K.
    New search for: Lee, E. J.
    New search for: Lee, H. S.
    New search for: No, T. H.
    New search for: Kim, D. H.
    New search for: Park, I. G.

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    Reliability during Thermal Shock Testing of NiCr Films on Mn-Ni-Co Oxide Substrates

    New search for: Jeon, M. S.
    New search for: Song, J. K.
    New search for: Lee, E. J.
    New search for: Lee, H. S.
    New search for: No, T. H.
    New search for: Kim, D. H.
    New search for: Park, I. G.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Reliability during Thermal Shock Testing of NiCr Films on Mn-Ni-Co Oxide Substrates

    New search for: Jeon, M. S.
    New search for: Song, J. K.
    New search for: Lee, E. J.
    New search for: Lee, H. S.
    New search for: No, T. H.
    New search for: Kim, D. H.
    New search for: Park, I. G.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
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    Document information
    Title:

    Reliability during Thermal Shock Testing of NiCr Films on Mn-Ni-Co Oxide Substrates

    Contributors:

    Jeon, M. S. (author) / Song, J. K. (author) / Lee, E. J. (author) / Lee, H. S. (author) / No, T. H. (author) / Kim, D. H. (author) / Park, I. G. (author)

    Published in:

    KEY ENGINEERING MATERIALS ; 317/318 ; 553-556

    Publication date:

    2006-01-01

    Size:

    4 pages

    ISSN:

    1013-9826

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.11

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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