A platform for research: civil engineering, architecture and urbanism
A platform for research: civil engineering, architecture and urbanism
Narrow surface transient and high depth resolution SIMS using 250eV O2+
Narrow surface transient and high depth resolution SIMS using 250eV O2+
Narrow surface transient and high depth resolution SIMS using 250eV O2+
Chanbasha, A. R. (author) / Wee, A. T. (author)
APPLIED SURFACE SCIENCE ; 252 ; 7243-7246
2006-01-01
4 pages
Article (Journal)
English
DDC:
621.35
© Metadata Copyright the British Library Board and other contributors. All rights reserved.
High depth resolution depth profiling of metal films using SIMS and sample rotation
| British Library Online Contents | 1996
High depth resolution depth profiling of metal films using SIMS and sample rotation
| British Library Online Contents | 1996
Some examples of depth resolution in SIMS analysis
| British Library Online Contents | 1993
Apparent and real transient effects in SIMS depth profiling using oxygen bombardment
| British Library Online Contents | 2003
| British Library Online Contents | 2004