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    Synergetic effect between ion energy and sample temperature in the formation of distinct dot pattern on Si(110) by ion-sputter erosion

    New search for: Li, W. Q.
    New search for: Qi, L. J.
    New search for: Yang, X.
    New search for: Ling, L.
    New search for: Fan, W. B.
    New search for: Zhao, Y. Y.
    New search for: Lu, M.

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    Synergetic effect between ion energy and sample temperature in the formation of distinct dot pattern on Si(110) by ion-sputter erosion

    New search for: Li, W. Q.
    New search for: Qi, L. J.
    New search for: Yang, X.
    New search for: Ling, L.
    New search for: Fan, W. B.
    New search for: Zhao, Y. Y.
    New search for: Lu, M.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Synergetic effect between ion energy and sample temperature in the formation of distinct dot pattern on Si(110) by ion-sputter erosion

    New search for: Li, W. Q.
    New search for: Qi, L. J.
    New search for: Yang, X.
    New search for: Ling, L.
    New search for: Fan, W. B.
    New search for: Zhao, Y. Y.
    New search for: Lu, M.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
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    Document information
    Title:

    Synergetic effect between ion energy and sample temperature in the formation of distinct dot pattern on Si(110) by ion-sputter erosion

    Contributors:

    Li, W. Q. (author) / Qi, L. J. (author) / Yang, X. (author) / Ling, L. (author) / Fan, W. B. (author) / Zhao, Y. Y. (author) / Lu, M. (author)

    Published in:

    APPLIED SURFACE SCIENCE ; 252 ; 7794-7800

    Publication date:

    2006-01-01

    Size:

    7 pages

    ISSN:

    0169-4332

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  621.35

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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