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Recent advances in high-resolution X-ray diffractometry applied to nanostructured oxide thin films: The case of yttria stabilized zirconia epitaxially grown on sapphire
Recent advances in high-resolution X-ray diffractometry applied to nanostructured oxide thin films: The case of yttria stabilized zirconia epitaxially grown on sapphire
Recent advances in high-resolution X-ray diffractometry applied to nanostructured oxide thin films: The case of yttria stabilized zirconia epitaxially grown on sapphire
Boulle, A. (author) / Guinebretiere, R. (author) / Masson, O. (author) / Bachelet, R. (author) / Conchon, F. (author) / Dauger, A. (author)
APPLIED SURFACE SCIENCE ; 253 ; 95-105
2006-01-01
11 pages
Article (Journal)
English
DDC:
621.35
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