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Structural characterization of InxGa1-xAs/Inp layers under different stresses

Bak-Misiuk, J. / Orlinska, K. / Kaniewski, J. / Shalimov, A. / Lusakowska, E. / Misiuk, A. / Muszalski, J. / Wierzchowski, W. / Wieteska, K. / Graeff, W.

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Structural characterization of InxGa1-xAs/Inp layers under different stresses

Bak-Misiuk, J. / Orlinska, K. / Kaniewski, J. / Shalimov, A. / Lusakowska, E. / Misiuk, A. / Muszalski, J. / Wierzchowski, W. / Wieteska, K. / Graeff, W.

Structural characterization of InxGa1-xAs/Inp layers under different stresses

Bak-Misiuk, J. / Orlinska, K. / Kaniewski, J. / Shalimov, A. / Lusakowska, E. / Misiuk, A. / Muszalski, J. / Wierzchowski, W. / Wieteska, K. / Graeff, W.

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Title:

Structural characterization of InxGa1-xAs/Inp layers under different stresses

Contributors:

Bak-Misiuk, J. (author) / Orlinska, K. (author) / Kaniewski, J. (author) / Shalimov, A. (author) / Lusakowska, E. (author) / Misiuk, A. (author) / Muszalski, J. (author) / Wierzchowski, W. (author) / Wieteska, K. (author) / Graeff, W. (author)

Published in:

APPLIED SURFACE SCIENCE ; 253 ; 261-265

Publication date:

2006-01-01

Size:

5 pages

ISSN:

Type of media:

Article (Journal)

Type of material:

Print

Language:

English

Classification:

© Metadata Copyright the British Library Board and other contributors. All rights reserved.

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