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    Characterization of Si nanocrystals into SiO2 matrix

    New search for: Gravalidis, C.
    New search for: Logothetidis, S.
    New search for: Hatziaras, N.
    New search for: Laskarakis, A.
    New search for: Tsiaoussis, I.
    New search for: Frangis, N.

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    Characterization of Si nanocrystals into SiO2 matrix

    New search for: Gravalidis, C.
    New search for: Logothetidis, S.
    New search for: Hatziaras, N.
    New search for: Laskarakis, A.
    New search for: Tsiaoussis, I.
    New search for: Frangis, N.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Characterization of Si nanocrystals into SiO2 matrix

    New search for: Gravalidis, C.
    New search for: Logothetidis, S.
    New search for: Hatziaras, N.
    New search for: Laskarakis, A.
    New search for: Tsiaoussis, I.
    New search for: Frangis, N.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
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    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Document information
    Title:

    Characterization of Si nanocrystals into SiO2 matrix

    Contributors:

    Gravalidis, C. (author) / Logothetidis, S. (author) / Hatziaras, N. (author) / Laskarakis, A. (author) / Tsiaoussis, I. (author) / Frangis, N. (author)

    Published in:

    APPLIED SURFACE SCIENCE ; 253 ; 385-388

    Publication date:

    2006-01-01

    Size:

    4 pages

    ISSN:

    0169-4332

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  621.35

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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