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Charging effects in Ge nanocrystals embedded in SiO2 matrix for non volatile memory applications
Charging effects in Ge nanocrystals embedded in SiO2 matrix for non volatile memory applications
Charging effects in Ge nanocrystals embedded in SiO2 matrix for non volatile memory applications
Kanoun, M. (author) / Baron, T. (author) / Gautier, E. (author) / Souifi, A. (author)
2006-01-01
4 pages
Article (Journal)
English
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