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    A transmission electron microscopy study on the atomic arrangement and grain growth of hexagonal structured Ge2Sb2Te5

    New search for: Park, Y. J.
    New search for: Lee, J. Y.
    New search for: Kim, Y. T.

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    A transmission electron microscopy study on the atomic arrangement and grain growth of hexagonal structured Ge2Sb2Te5

    New search for: Park, Y. J.
    New search for: Lee, J. Y.
    New search for: Kim, Y. T.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    A transmission electron microscopy study on the atomic arrangement and grain growth of hexagonal structured Ge2Sb2Te5

    New search for: Park, Y. J.
    New search for: Lee, J. Y.
    New search for: Kim, Y. T.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
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    Document information
    Similar titles

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    Document information
    Title:

    A transmission electron microscopy study on the atomic arrangement and grain growth of hexagonal structured Ge2Sb2Te5

    Contributors:

    Park, Y. J. (author) / Lee, J. Y. (author) / Kim, Y. T. (author)

    Published in:

    APPLIED SURFACE SCIENCE ; 253 ; 714-719

    Publication date:

    2006-01-01

    Size:

    6 pages

    ISSN:

    0169-4332

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  621.35

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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