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Characterization of Dislocation Structures in Hexagonal SiC by Transmission Electron Microscopy
Characterization of Dislocation Structures in Hexagonal SiC by Transmission Electron Microscopy
Characterization of Dislocation Structures in Hexagonal SiC by Transmission Electron Microscopy
Sugawara, Y. (author) / Yao, Y. (author) / Ishikawa, Y. (author) / Danno, K. (author) / Suzuki, H. (author) / Bessho, T. (author) / Kawai, Y. (author) / Ikuhara, Y. (author) / Yamada-Kaneta, H. / Sakai, A.
2012-01-01
4 pages
Article (Journal)
English
DDC:
620.11
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