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Using time-of-flight secondary ion mass spectrometry and multivariate statistical analysis to detect and image octabenzyl-polyhedral oligomeric silsesquioxane in polycarbonate
Using time-of-flight secondary ion mass spectrometry and multivariate statistical analysis to detect and image octabenzyl-polyhedral oligomeric silsesquioxane in polycarbonate
Using time-of-flight secondary ion mass spectrometry and multivariate statistical analysis to detect and image octabenzyl-polyhedral oligomeric silsesquioxane in polycarbonate
Smentkowski, V. S. (author) / Duong, H. M. (author) / Tamaki, R. (author) / Keenan, M. R. (author) / Ohlhausen, J. A. (author) / Kotula, P. G. (author)
APPLIED SURFACE SCIENCE ; 253 ; 1015-1022
2006-01-01
8 pages
Article (Journal)
English
DDC:
621.35
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