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Characterization of a Co-Se thin film by scanning Auger microscopy and Raman spectroscopy

Teo, M. / Wong, P. C. / Zhu, L. / Susac, D. / Campbell, S. A. / Mitchell, K. A. / Parsons, R. R. / Bizzotto, D.

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Characterization of a Co-Se thin film by scanning Auger microscopy and Raman spectroscopy

Teo, M. / Wong, P. C. / Zhu, L. / Susac, D. / Campbell, S. A. / Mitchell, K. A. / Parsons, R. R. / Bizzotto, D.

Characterization of a Co-Se thin film by scanning Auger microscopy and Raman spectroscopy

Teo, M. / Wong, P. C. / Zhu, L. / Susac, D. / Campbell, S. A. / Mitchell, K. A. / Parsons, R. R. / Bizzotto, D.

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Document information

Title:

Characterization of a Co-Se thin film by scanning Auger microscopy and Raman spectroscopy

Contributors:

Teo, M. (author) / Wong, P. C. (author) / Zhu, L. (author) / Susac, D. (author) / Campbell, S. A. (author) / Mitchell, K. A. (author) / Parsons, R. R. (author) / Bizzotto, D. (author)

Published in:

APPLIED SURFACE SCIENCE ; 253 ; 1130-1134

Publication date:

2006-01-01

Size:

5 pages

ISSN:

0169-4332

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 621.35

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