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    Scanning Auger microscopy study of electromigration induced failure in submicrometric microelectronic devices

    New search for: Santucci, S.
    New search for: Lozzi, L.
    New search for: Pacifico, D.
    New search for: Alfonsetti, R.
    New search for: Moccia, G.

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    Scanning Auger microscopy study of electromigration induced failure in submicrometric microelectronic devices

    New search for: Santucci, S.
    New search for: Lozzi, L.
    New search for: Pacifico, D.
    New search for: Alfonsetti, R.
    New search for: Moccia, G.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Scanning Auger microscopy study of electromigration induced failure in submicrometric microelectronic devices

    New search for: Santucci, S.
    New search for: Lozzi, L.
    New search for: Pacifico, D.
    New search for: Alfonsetti, R.
    New search for: Moccia, G.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Document information
    Title:

    Scanning Auger microscopy study of electromigration induced failure in submicrometric microelectronic devices

    Contributors:

    Santucci, S. (author) / Lozzi, L. (author) / Pacifico, D. (author) / Alfonsetti, R. (author) / Moccia, G. (author)

    Published in:

    APPLIED SURFACE SCIENCE ; 144 ; 329-333

    Publication date:

    1999-01-01

    Size:

    5 pages

    ISSN:

    0169-4332

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  621.35

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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