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X-ray multiple diffraction in the characterization of TiNO and TiO2 thin films grown on Si(001)
X-ray multiple diffraction in the characterization of TiNO and TiO2 thin films grown on Si(001)
X-ray multiple diffraction in the characterization of TiNO and TiO2 thin films grown on Si(001)
Chiaramonte, T. (author) / Abramof, E. (author) / Fabreguette, F. (author) / Sacilotti, M. (author) / Cardoso, L. P. (author)
APPLIED SURFACE SCIENCE ; 253 ; 1590-1594
2006-01-01
5 pages
Article (Journal)
English
DDC:
621.35
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