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Bias Stress-Induced Threshold-Voltage Instability of SiC MOSFETs

Lelis, A. J. / Habersat, D. B. / Lopez, G. / McGarrity, J. M. / McLean, F. B. / Goldsman, N.

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Bias Stress-Induced Threshold-Voltage Instability of SiC MOSFETs

Lelis, A. J. / Habersat, D. B. / Lopez, G. / McGarrity, J. M. / McLean, F. B. / Goldsman, N.

Bias Stress-Induced Threshold-Voltage Instability of SiC MOSFETs

Lelis, A. J. / Habersat, D. B. / Lopez, G. / McGarrity, J. M. / McLean, F. B. / Goldsman, N.

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Title:

Bias Stress-Induced Threshold-Voltage Instability of SiC MOSFETs

Contributors:

Lelis, A. J. (author) / Habersat, D. B. (author) / Lopez, G. (author) / McGarrity, J. M. (author) / McLean, F. B. (author) / Goldsman, N. (author) / Devaty, R. P. / Larkin, D. J. / Saddow, S. E.

Published in:

Silicon Carbide and Related Materials - 2005 ; 1317-1320

MATERIALS SCIENCE FORUM ; 527/529

Publication date:

2006-01-01

Size:

4 pages

ISSN:

0255-5476

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 620.11

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