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Deep Level Point Defects in Semi-Insulating SiC

Zvanut, M. E. / Lee, W. W. / Wang, H. / Mitchel, W. C. / Mitchell, W. D.

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Deep Level Point Defects in Semi-Insulating SiC

Zvanut, M. E. / Lee, W. W. / Wang, H. / Mitchel, W. C. / Mitchell, W. D.

Deep Level Point Defects in Semi-Insulating SiC

Zvanut, M. E. / Lee, W. W. / Wang, H. / Mitchel, W. C. / Mitchell, W. D.

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Check availability in my library

Order at Subito €

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Document information

Title:

Deep Level Point Defects in Semi-Insulating SiC

Contributors:

Zvanut, M. E. (author) / Lee, W. W. (author) / Wang, H. (author) / Mitchel, W. C. (author) / Mitchell, W. D. (author) / Devaty, R. P. / Larkin, D. J. / Saddow, S. E.

Published in:

Silicon Carbide and Related Materials - 2005 ; 517-522

MATERIALS SCIENCE FORUM ; 527/529

Publication date:

2006-01-01

Size:

6 pages

ISSN:

0255-5476

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 620.11

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