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Characterization of SiC Substrates Using X-Ray Rocking Curve Mapping
Characterization of SiC Substrates Using X-Ray Rocking Curve Mapping
Characterization of SiC Substrates Using X-Ray Rocking Curve Mapping
Yoganathan, M. (author) / Emorhokpor, E. (author) / Kerr, T. (author) / Gupta, A. (author) / Tanner, C. D. (author) / Zwieback, I. (author) / Devaty, R. P. / Larkin, D. J. / Saddow, S. E.
2006-01-01
4 pages
Article (Journal)
English
DDC:
620.11
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