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X-Ray Rocking Curve Characterization of SiC Substrates
X-Ray Rocking Curve Characterization of SiC Substrates
X-Ray Rocking Curve Characterization of SiC Substrates
Yoganathan, M. (author) / Wu, P. (author) / Zwieback, I. (author)
MATERIALS SCIENCE FORUM ; 600/603 ; 361-364
2009-01-01
4 pages
Article (Journal)
English
DDC:
620.11
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