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    Ultrahigh Vacuum Non-Contact Atomic Force Microscope Observation of Reconstructed Si(110) Surface

    New search for: Miyachi, A.
    New search for: Sone, H.
    New search for: Hosaka, S.

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    Ultrahigh Vacuum Non-Contact Atomic Force Microscope Observation of Reconstructed Si(110) Surface

    New search for: Miyachi, A.
    New search for: Sone, H.
    New search for: Hosaka, S.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Ultrahigh Vacuum Non-Contact Atomic Force Microscope Observation of Reconstructed Si(110) Surface

    New search for: Miyachi, A.
    New search for: Sone, H.
    New search for: Hosaka, S.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

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    Document information
    Similar titles

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    Document information
    Title:

    Ultrahigh Vacuum Non-Contact Atomic Force Microscope Observation of Reconstructed Si(110) Surface

    Contributors:

    Miyachi, A. (author) / Sone, H. (author) / Hosaka, S. (author)

    Published in:

    MATERIALS TRANSACTIONS ; 47 ; 2595-2598

    Publication date:

    2006-01-01

    Size:

    4 pages

    ISSN:

    1345-9678

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.11

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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