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Potential experimental error for determining CTE of stressed thin films

Wang, Z. D. / Jiang, S. Q.

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Potential experimental error for determining CTE of stressed thin films

Wang, Z. D. / Jiang, S. Q.

Potential experimental error for determining CTE of stressed thin films

Wang, Z. D. / Jiang, S. Q.

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Access via TIB

Check availability in my library

Order at Subito €

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Document information

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Document information

Title:

Potential experimental error for determining CTE of stressed thin films

Contributors:

Wang, Z. D. (author) / Jiang, S. Q. (author)

Published in:

POLYMER TESTING -LONDON- ; 26 ; 116-121

Publication date:

2007-01-01

Size:

6 pages

ISSN:

0142-9418

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 620.192

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