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Micro- and Nanoscale Deformation Measurement of Surface and Internal Planes via Digital Image Correlation
Micro- and Nanoscale Deformation Measurement of Surface and Internal Planes via Digital Image Correlation
Micro- and Nanoscale Deformation Measurement of Surface and Internal Planes via Digital Image Correlation
Berfield, T. A. (author) / Patel, J. K. (author) / Shimmin, R. G. (author) / Braun, P. V. (author) / Lambros, J. (author) / Sottos, N. R. (author)
EXPERIMENTAL MECHANICS ; 47 ; 51-62
2007-01-01
12 pages
Article (Journal)
English
DDC:
620.1
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