Chemical characterization by XPS of Cu/Ge ohmic contacts to n-GaAs: Fid-Bau Portal

Chemical characterization by XPS of Cu/Ge ohmic contacts to n-GaAs

Lopez, M. C. / Galiana, B. / Algora, C. / Rey-Stolle, I. / Gabas, M. / Ramos-Barrado, J. R.

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Chemical characterization by XPS of Cu/Ge ohmic contacts to n-GaAs

Lopez, M. C. / Galiana, B. / Algora, C. / Rey-Stolle, I. / Gabas, M. / Ramos-Barrado, J. R.

Chemical characterization by XPS of Cu/Ge ohmic contacts to n-GaAs

Lopez, M. C. / Galiana, B. / Algora, C. / Rey-Stolle, I. / Gabas, M. / Ramos-Barrado, J. R.

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Check availability in my library

Order at Subito €

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Document information

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Document information

Title:

Chemical characterization by XPS of Cu/Ge ohmic contacts to n-GaAs

Contributors:

Lopez, M. C. (author) / Galiana, B. (author) / Algora, C. (author) / Rey-Stolle, I. (author) / Gabas, M. (author) / Ramos-Barrado, J. R. (author)

Published in:

APPLIED SURFACE SCIENCE ; 253 ; 5062-5066

Publication date:

2007-01-01

Size:

5 pages

ISSN:

0169-4332

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 621.35

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