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Microstructure characterization of porous silicon as studied by positron annihilation measurements at low temperatures and high vacuum
Microstructure characterization of porous silicon as studied by positron annihilation measurements at low temperatures and high vacuum
Microstructure characterization of porous silicon as studied by positron annihilation measurements at low temperatures and high vacuum
Banerji, P. (author)
APPLIED SURFACE SCIENCE ; 253 ; 5129-5132
2007-01-01
4 pages
Article (Journal)
English
DDC:
621.35
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