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    Measurement of Potential Drop Distribution by Scanning the Closely Coupled Probes Sensor for Sensitive NDE of Shallow Surface Cracks

    New search for: Tohmyoh, H.
    New search for: Suzuki, T.
    New search for: Ahmed, S. R.
    New search for: Saka, M.

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    Measurement of Potential Drop Distribution by Scanning the Closely Coupled Probes Sensor for Sensitive NDE of Shallow Surface Cracks

    New search for: Tohmyoh, H.
    New search for: Suzuki, T.
    New search for: Ahmed, S. R.
    New search for: Saka, M.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Measurement of Potential Drop Distribution by Scanning the Closely Coupled Probes Sensor for Sensitive NDE of Shallow Surface Cracks

    New search for: Tohmyoh, H.
    New search for: Suzuki, T.
    New search for: Ahmed, S. R.
    New search for: Saka, M.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Document information
    Title:

    Measurement of Potential Drop Distribution by Scanning the Closely Coupled Probes Sensor for Sensitive NDE of Shallow Surface Cracks

    Contributors:

    Tohmyoh, H. (author) / Suzuki, T. (author) / Ahmed, S. R. (author) / Saka, M. (author)

    Published in:

    MATERIALS TRANSACTIONS ; 48 ; 1166-1172

    Publication date:

    2007-01-01

    Size:

    7 pages

    ISSN:

    1345-9678

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.11

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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