Fachinformationsdienst BAUdigital

A platform for research: civil engineering, architecture and urbanism

    Ellipsometric Characterization on Multi-Layered Thin Film Systems during Hydrogenation

    New search for: Santjojo, D. J.
    New search for: Aizawa, T.
    New search for: Muraishi, S.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Ellipsometric Characterization on Multi-Layered Thin Film Systems during Hydrogenation

    New search for: Santjojo, D. J.
    New search for: Aizawa, T.
    New search for: Muraishi, S.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Ellipsometric Characterization on Multi-Layered Thin Film Systems during Hydrogenation

    New search for: Santjojo, D. J.
    New search for: Aizawa, T.
    New search for: Muraishi, S.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Document information
    Title:

    Ellipsometric Characterization on Multi-Layered Thin Film Systems during Hydrogenation

    Contributors:

    Santjojo, D. J. (author) / Aizawa, T. (author) / Muraishi, S. (author)

    Published in:

    MATERIALS TRANSACTIONS ; 48 ; 1380-1386

    Publication date:

    2007-01-01

    Size:

    7 pages

    ISSN:

    1345-9678

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.11

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

    Similar titles

    Transparent ellipsometric memory with thin film multilayer structures

    Tazawa, M. / Xu, G. / Jin, P. | British Library Online Contents | 2003

    Ellipsometric Characterization of Copper Deposits

    Sandmann, G. / Plieth, W. / Lacconi, G. I. et al. | British Library Online Contents | 1998

    Spectroscopic ellipsometric characterization of approximant thin films of Al-Cr-Fe

    Johann, L. / En Naciri, A. / Broch, L. et al. | British Library Online Contents | 2003

    Ellipsometric characterization of thin porous GaAs layers formed in HF solutions

    Zangooie, S. / Woollam, J. A. | British Library Online Contents | 2000

    Ellipsometric study and application of rubrene thin film in organic Schottky diode

    Chen, L. / Deng, J. / Gao, H. et al. | British Library Online Contents | 2016

    Back to top